nGauge AFM
Location
B04 McCourtney
Capabilities
- Tapping mode
- Ambient air, dry samples
- Topography, phase and error scans
- 20 µm × 20 µm maximum scan area
- 60 µm maximum line scan length
- <0.5 nm XY scanner resolution
- 10 µm Z scanner range (Rz)
- <1 nm rms noise floor (dynamic)
Typical Use
- Characterize surface topology of nanofibers and thin films and other samples
Internal Hourly Rates
- Unassisted: $26
- Assisted: $67
External Hourly Rates
- Unassisted: $45
- Assisted: $99
Instrument Availability
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