nGauge AFM

nGauge AFM

Location

B04 McCourtney

Capabilities

  • Tapping mode
  • Ambient air, dry samples
  • Topography, phase and error scans
  • 20 µm × 20 µm maximum scan area
  • 60 µm maximum line scan length
  • <0.5 nm XY scanner resolution
  • 10 µm Z scanner range (Rz)
  • <1 nm rms noise floor (dynamic)    

Typical Use

  • Characterize surface topology of nanofibers and thin films and other samples

Internal Hourly Rates

  • Unassisted: $26
  • Assisted: $66

External Hourly Rates 

  • Unassisted: $44
  • Assisted: $96

Instrument Availability 

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